Research Publications by Date
Below is a list of all research publications sorted by date, most recent first. Alternatively, browse the lists of all publications by date (research and non-research).
| A Two-Tiered Self-Powered Wireless Monitoring System Architecture for Bridge Health Management | |
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M. Kurata, J. P. Lynch, T. Galchev, M. Flynn, P. Hipley, V. Jacob, G. W. van der Linden, A. Mortazawi, K. Najafi, R. L. Peterson, L.-H. Sheng, D. Sylvester, E. Thometz, A Two-Tiered Self-Powered Wireless Monitoring System Architecture for Bridge Health Management, In: "Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010", Ed. Peter J. Shull, Aaron A. Diaz, H. Felix Wu, doi: 10.1117/12.848212, Proc. of SPIE Vol. 7649, San Diego, CA, USA, March 7-11, 2010. |
| Near-Optimal Sensor Placement for Health Monitoring of Civil Structures | |
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G. W. van der Linden, A. Emami-Naeini, R. L. Kosut, H. Sedarat, J. P. Lynch, Near-Optimal Sensor Placement for Health Monitoring of Civil Structures, In: "Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2010", Ed. Peter J. Shull, Aaron A. Diaz, H. Felix Wu, doi: 10.1117/12.847704, Proc. of SPIE Vol. 7649, San Diego, CA, USA, March 7-11, 2010. |
| Feedback Control of Dynamic Systems - Sixth Edition | |
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Gene F. Franklin, J. David Powell, Abbas Emami-Naeini, Feedback Control of Dynamic Systems, 6th edition, Prentice-Hall, 2010, ISBN-10: 0136019692, ISBN-13: 9780136019695. |
| Quantum Process Tomography via L1-norm Minimization | |
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Robert L. Kosut, Quantum Process Tomography via L1-norm Minimization, arXiv:0812.4323v1 [quant-ph], 12/23/2008. |
| Control in Semiconductor Wafer Manufacturing | |
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Abbas Emami-Naeini, Dick de Roover, Control in Semiconductor Wafer Manufacturing, 47th IEEE Conference on Decision and Control, Cancun, Mexico, December 9-11, 2008. |
| Channel-Optimized Quantum Error Correction | |
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Soraya Taghavi, Robert L. Kosut, Daniel A. Lidar, Channel-Optimized Quantum Error Correction, arXiv:0810.2524v1 [quant-ph], 10/14/2008. |
| Model-Based Control and Virtual Sensing with Application to a Vertical Furnace | |
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J. L. Ebert, N. Acharya, D. de Roover, A. Emami-Naeini, R. L. Kosut, J. Zhang, Model-Based Control and Virtual Sensing with Application to a Vertical Furnace, AEC/APC Symposium, Salt Lake City, Utah, 2008. |
| Quantum Metrology Subject to Instrumentation Constraints | |
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Robert L. Kosut, Quantum Metrology Subject to Instrumentation Constraints, arXiv:0803.4284v1 [quant-ph], 3/29/2008. |
| Fidelity of optimally controlled quantum gates with randomly coupled multiparticle environments | |
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Matthew D. Grace, Constantin Brif, Herschel Rabitz, Daniel A. Lidar, Ian A. Walmsley, Robert L. Kosut, Fidelity of optimally controlled quantum gates with randomly coupled multiparticle environments, arXiv:0712.2935v1 [quant-ph], Special issue of the Journal of Modern Optics: 37th Winter Colloquium on the Physics of Quantum Electronics, 2-6 January 2007. |
| Robust Quantum Error Correction via Convex Optimization | |
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R.L. Kosut, A. Shabani, D.A. Lidar, Robust Quantum Error Correction via Convex Optimization, arXiv:quant-ph/0703274v2, Phys. Rev. Lett. 100, 020502 (2008). |
| An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design | |
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D. de Roover, L. Porter II, A. Emami-Naeini, J. Marohn, S. Kuehn, S. Garner, and D. Smith, An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design, NanoTech 2007: NSTI Nanotechnology Conference and Trade Show, Santa Clara, May 20-24, 2007. |
| Optimal control of quantum gates and suppression of decoherence in a system of interacting two-level particles | |
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Matthew Grace, Constantin Brif, Herschel Rabitz, Ian A. Walmsley, Robert L. Kosut, Daniel A. Lidar, Optimal control of quantum gates and suppression of decoherence in a system of interacting two-level particles, arXiv:quant-ph/0702147v2, J. Phys. B: At. Mol. Opt. Phys. 40, S103-S125 (2007) |
| Optimal Control of High-Fidelity Quantum Gates in the Presence of Decoherence | |
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Matthew Grace, Constantin Brif, Herschel Rabitz, Ian Walmsley, Robert Kosut, Daniel A. Lidar, Optimal Control of High-Fidelity Quantum Gates in the Presence of Decoherence, arXiv:quant-ph/0611189v2, 2/2/2007. |
| Quantum Error Correction via Convex Optimization | |
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Robert L. Kosut, Daniel A. Lidar, Quantum Error Correction via Convex Optimization, arXiv:quant-ph/0606078v1, 6/9/2006. |
| On the distance between unitary propagators of quantum systems of differing dimensions | |
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Robert L. Kosut, Matthew Grace, Constantin Brif, Herschel Rabitz, On the distance between unitary propagators of quantum systems of differing dimensions, arXiv:quant-ph/0606064v1, 6/7/2006. |
| Encoding a qubit into multilevel subspaces | |
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Matthew Grace, Constantin Brif, Herschel Rabitz, Ian Walmsley, Robert Kosut, Daniel Lidar, Encoding a qubit into multilevel subspaces, arXiv:quant-ph/0412059v3, New J. Phys. 8, 35 (2006). |
| Active Control of Flow Over a Backward-Facing Step | |
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A. Emami-Naeini, S.A. McCabe, D. de Roover, J.L. Ebert; R.L. Kosut, Active Control of Flow Over a Backward-Facing Step, 44th IEEE Conference on Decision and Control 2005 and 2005 European Control Conference CDC-ECC '05., page(s): 7366 - 7371, 12-15 Dec. 2005. |
| Feedback Control of Dynamic Systems - Fifth Edition | |
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Gene Franklin, J. David Powell, Abbas Emami-Naeini, Feedback Control of Dynamic Systems, 5th edition, Prentice-Hall, 2006, ISBN: 0-13-149930-0, 912p. |
| Optimal Experiment Design for Quantum State and Process Tomography and Hamiltonian Parameter Estimation | |
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Robert Kosut, Ian A. Walmsley, Herschel Rabitz, Optimal Experiment Design for Quantum State and Process Tomography and Hamiltonian Parameter Estimation, arXiv:quant-ph/0411093v1, 11/12/2004. |
| Model-based control of rapid thermal processing for semiconductor wafers | |
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Ebert, J.L.; de Roover, D.; Porter, L.L., II; Lisiewicz, V.A.; Ghosal, S.; Kosut, R.L.; Emami-Naeini, A.; Model-based control of rapid thermal processing for semiconductor wafers, Proceedings of the 2004 American Control Conference, page(s): 3910 - 3921 vol.5, 2004. |
| Model-based control for semiconductor and advanced materials processing: an overview | |
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A. Emami-Naeini, J.L. Ebert, R.L. Kosut, D. de Roover, S. Ghosal, Model-based control for semiconductor and advanced materials processing: an overview, Proceedings of the 2004 American Control Conference, 30 June -2 July 2004, page(s): 3902 - 3909 vol.5, 2004. |
| Multiscale Modeling and Control of RF Diode Sputter Deposition for GMR Thin Films | |
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S. Ghosal, R. L. Kosut, J. L. Ebert, and L. L. Porter II, Multiscale Modeling and Control of RF Diode Sputter Deposition for GMR Thin Films, Proceedings of the 2004 American Control Conference, 30 June-2 July 2004, Volume: 5, pp. 3930-3941, 2004. |
| Model-based control for chemical-mechanical planarization (CMP) | |
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de Roover, D.; Emami-Naeini, A.; Ebert, J.L., Model-based control for chemical-mechanical planarization (CMP), Proceedings of the 2004 American Control Conference, Volume 5, 30 June-2 July 2004, pp. 3922-3929, 2004. |
| Quantum State Detector Design: Optimal Worst-Case a posteriori Performance | |
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Robert L. Kosut, Ian Walmsley, Yonina Eldar, Herschel Rabitz, Quantum State Detector Design: Optimal Worst-Case a posteriori Performance, arXiv:quant-ph/0403150v1, 3/21/2004. |
| Modeling and Control of Distributed Thermal Systems | |
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A. Emami-Naeini, J. L. Ebert, D. de Roover, R. L. Kosut, M. Dettori, L. M. Porter, S. Ghosal, Modeling and control of distributed thermal systems, IEEE Transactions on Control Systems Technology, Volume 11, Issue 5, Page(s):668 - 683, Sept. 2003. |
| Iterative Adaptive Control: Windsurfing with Confidence | |
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R. L. Kosut, "Iterative Adaptive Control: Windsurfing with Confidence", Chapter in Model Identification and Adaptive Control: From Windsurfing to Telecommunications, G. Goodwin (ed.), Springer-Verlag, 2001. |
| On Achieving Reduced Error Propagation Sensitivity in DFE Design via Convex Optimization | |
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R. L. Kosut, W. Chung, C. R. Johnson, Jr., and S. P. Boyd, On Achieving Reduced Error Propagation Sensitivity in DFE Design via Convex Optimization, Proceedings of the 39th IEEE Conference on Decision and Control, Sydney, Australia, December, 2000. |
| Multi-Scale Model of the RF Diode Sputter Deposition of GMR Thin Films | |
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S. Ghosal, R. L. Kosut, J. L. Ebert, A. Kozak, T. E. Abrahamson, W. Zou, X. W. Zhou, J. F. Groves, Y. G. Yang, H. N. G. Wadley, D. Brownell, and D. Wang, Multi-Scale Model of the RF Diode Sputter Deposition of GMR Thin Films, Application notes, 2000. |
| Command Shaping for MIMO Nonlinear Systems Using Iterative Learning Control with Application to an RTP System | |
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D. de Roover, A. Emami-Naeini, J. L. Ebert, R. L. Kosut, Command Shaping for MIMO Nonlinear Systems Using Iterative Learning Control with Application to an RTP System, Proceedings of the ASME Dynamic Systems and Control Divison-2000, pp. 153-161, November 2000. |
| Control of Sputter Process for Improved Run-to-run Repeatability | |
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S. Ghosal, R. L. Kosut, J. L. Ebert, L. Porter, D. Brownell, and D. Wang, Control of Sputter Process for Improved Run-to-run Repeatability, S. C. Application Notes, 2000. |
| Active Control in Structures | |
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H. Sedarat, H. Sedarat, R. Kosut, Active Control in Structures, 13th ASCE Engineering Mechanics Division Conference held in Baltimore, June 13-16, 1999. |
| Feedback Control of Morphology During III-V Semiconductor Growth by Molecular Beam Epitaxy | |
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R. L. Kosut, R. Caflisch, M. Gyure, D. G. Meyer, A. Engelmann, Feedback Control of Morphology During III-V Semiconductor Growth by Molecular Beam Epitaxy, Proceedings of the 38th Conference on Decision & Control, Phoenix, AZ, December 1999, pp. 4204-4208. |
| Tradeoffs in Temperature Control of Fast-Ramp RTO and RTA Systems | |
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D. de Roover, A. Emami-Naeini, J. L. Ebert, R. L. Kosut, Tradeoffs in Temperature Control of Fast-Ramp RTO and RTA Systems, Proceedings of the Seventh International Conference on Advanced Thermal Processing of Semiconductors, RTP '99, Colorado Springs, September 1999. |
| Silicon Epitaxy White Paper | |
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SC Solutions, Inc., "Reactor-scale Model of Silicon Epitaxy Process", Application Notes, 1999. |
| Reactor-scale Modeling and Control for MOCVD of YBCO High Temperature Superconductors | |
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Reactor-scale Modeling and Control for MOCVD of YBCO High Temperature Superconductors, Application Notes, SC Solutions, Inc., 1999. |
| Model-based Control of MOCVD Rate, Uniformity and Stoichiometry | |
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S. Ghosal, J. L. Ebert, D. de Roover, and A. Emami-Naeini, Model-based Control of MOCVD Rate, Uniformity and Stoichiometry, Presented at the Third Symposium of Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing, 195th Meeting of the Electrochemical Society, Seattle, May 2-6, 1999. |
| A Physical Model for Drying of Gelcast Ceramics | |
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S. Ghosal, A. Emami-Naeini, Y. P. Harn, B. Draskovich, and J. P. Pollinger, A Physical Model for Drying of Gelcast Ceramics, Journal of the American Ceramic Society, Vol. 82, No. 3, pp. 513-520, 1999. |
| Run-to-Run Control of Static Systems | |
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D. de Roover, R. L. Kosut, A. Emami-Naeini, and J. L. Ebert, Run-to-Run Control of Static Systems, Proceedings of the 37th IEEE Conference on Decision and Control, pp. 695-700, Tampa, Florida, December, 1998. |
| Linear Multivariable Servomechanisms Revisited: System Type and Accuracy Trade-offs | |
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B. A. L. de la Barra, A. Emami-Naeini, and E. R. Chinchon, Linear Multivariable Servomechanisms Revisited: System Type and Accuracy Trade-offs, Automatica, Vol. 34, No. 11, pp. 1449-1452, 1998. |
| Model-Based Control of Fast-Ramp RTP Systems | |
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D. de Roover, A. Emami-Naeini, J. L. Ebert, S. Ghosal, and G. W. van der Linden, Model-Based Control of Fast-Ramp RTP Systems, Proceedings of the Sixth International Conference on Advanced Thermal Processing of Semiconductors, RTP '98, Kyoto, Japan, September 9-11, 1998. |
| Efficient CFD Modeling of Single Wafer Semiconductor Systems for Closed-Loop Evaluation | |
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J. L. Ebert, G. W. van der Linden, R. L. Kosut, and A. Emami-Naeini, Efficient CFD Modeling of Single Wafer Semiconductor Systems for Closed-Loop Evaluation, Proceedings of the 36th IEEE Conference on Decision and Control, pp. 830-831, December, 1997. |
| Real-Time Model-Based Control Systems Design for Gelcast Drying Process | |
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Y. P. Harn, S. Ghosal, G. Aral, A. Emami-Naeini, B. Draskovich, and L. C. Maxey, Real-Time Model-Based Control Systems Design for Gelcast Drying Process, Proceedings of the 1997 IEEE International Conference on Control Applications, Hartford, CT. October 5-7, 1997. |
| Efficient CFD Modeling of Single Wafer System for Closed-Loop Evaluation | |
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J. L. Ebert, G. W. van der Linden, R. L. Kosut, and A. Emami-Naeini, Efficient CFD Modeling of Single Wafer System for Closed-Loop Evaluation, Proceedings of the Fifth International Conference on Advanced Thermal Processing of Semiconductors, RTP '97, New Orleans, LA, September 3-5, 1997. |