SC‐MDD™ Compact Whole‐Wafer Scanner

SC Solutions’ Macro Defect Detection system, SC‐MDD™, is a production‐proven tool that rapidly detects and classifies macro defects for every wafer being processed. SC‐MDD™ includes scanner hardware as well as SC‐WDD™ software which controls the scanning process,...

SC-MDD™ Macro Defect Scanner

SC-MDD™ Macro Defect Scanner Rapid In-line Detection of Macro Defects The complexity of integrated circuits (ICs) continues to increase with shrinking device geometries. There is an associated increase in the number of processing steps to manufacture IC’s and...