Semiconductor | SC Solutions

APCSM Conference at Austin, TX, October 10-13, 2022

Sep 20, 2022 | Company, Control Engineering

SC Solutions was again a sponsor for the annual Advanced Process Control Smart Manufacturing (APCSM) Conference and gave an in-person presentation there on the application of Digital Twins technology to semiconductor wafer processing. The APCSM conference, which was...

Physics-informed Machine Learning for Control – DNN in a Dynamic Feedback Loop

Dec 6, 2021

This Case Study describes an approach to combining physical principles with Machine Learning (ML) for modeling and control of complex systems. Our approach was developed as part of a DARPA-funded research project. It was applied to oil reservoir management. While this Case Study provides an overview, technical details may be found in a separate publication [1].

Physics-informed Machine Learning for Control – DNN in a Dynamic Feedback Loop

Dec 6, 2021

This Case Study describes an approach to combining physical principles with Machine Learning (ML) for modeling and control of complex systems. Our approach was developed as part of a DARPA-funded research project. It was applied to oil reservoir management. While this...

SC‐MDD™ Compact Whole‐Wafer Scanner

Oct 1, 2020

SC Solutions’ Macro Defect Detection system, SC‐MDD™, is a production‐proven tool that rapidly detects and classifies macro defects for every wafer being processed. SC‐MDD™ includes scanner hardware as well as SC‐WDD™ software which controls the scanning process,...

Reactor-scale Modeling of Silicon Epitaxy

Oct 1, 2020

This case study of epitaxial deposition of silicon film on a silicon substrate in a horizontal hot-wall reactor reproduces an earlier modeling study by Habuka et al. [1]. The steady-state finite element (FEM) model incorporates fluid flow, heat transfer, dilute...