SC‐MDD™ Compact Whole‐Wafer Scanner

SC Solutions’ Macro Defect Detection system, SC‐MDD™, is a production‐proven tool that rapidly detects and classifies macro defects for every wafer being processed. SC‐MDD™ includes scanner hardware as well as SC‐WDD™ software which controls the scanning process,...

Reactor-scale Modeling of Silicon Epitaxy

This case study of epitaxial deposition of silicon film on a silicon substrate in a horizontal hot-wall reactor reproduces an earlier modeling study by Habuka et al. [1]. The steady-state finite element (FEM) model incorporates fluid flow, heat transfer, dilute...